Semiconductor memory device having error checking and...

Static information storage and retrieval – Systems using particular element – Ferroelectric

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S200000, C365S203000

Reexamination Certificate

active

07397685

ABSTRACT:
A semiconductor memory device includes a memory cell including a ferroelectric capacitor and a cell transistor and storing binary data at a first potential level and a second potential level which is higher than the first potential level, a bit line which reads the binary data from the memory cell, a correction circuit which corrects an error of the binary data read from the memory cell via the bit line, and a setting circuit which sets to the first potential a potential of the bit line connected to the memory cell from which at least the binary data is read, after the binary data is transferred to the correction circuit. The device further includes a control circuit which controls the potential of the bit line connected to the memory cell from which the binary data is read, in accordance with a result of error correction of the binary data.

REFERENCES:
patent: 2005/0094476 (2005-05-01), Noda
patent: 11-16389 (1999-01-01), None
patent: 2004-213719 (2004-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor memory device having error checking and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory device having error checking and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device having error checking and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3970922

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.