Semiconductor memory device having a floating storage bulk...

Static information storage and retrieval – Systems using particular element – Capacitors

Reexamination Certificate

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Details

C365S149000, C365S051000, C365S063000, C257S350000, C257S347000

Reexamination Certificate

active

11199185

ABSTRACT:
A semiconductor memory device includes: a semiconductor layer which is formed on an insulating layer; a plurality of transistors which are formed on the semiconductor layer and arranged in a matrix form, each of the transistors having a gate electrode, a source region and a drain region, the electrodes in one direction constituting word lines; source contact plugs which are connected to the source regions of the transistors; drain contact plugs which are connected to the drain regions of the transistors; source wirings each of which commonly connects the source contact plugs; and bit lines which are formed so as to cross the word lines and which are connected to the drain regions of the transistors via the drain contact plugs. Each of the transistors has a first data state having a first threshold voltage and a second data state having a second threshold voltage.

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English translation of JP 5-86864.
English translation of JP 5-87027.

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