Static information storage and retrieval – Read/write circuit – Including signal comparison
Reexamination Certificate
2008-06-30
2010-11-02
Yoha, Connie C (Department: 2827)
Static information storage and retrieval
Read/write circuit
Including signal comparison
C365S189090, C365S189110, C365S226000, C365S230030
Reexamination Certificate
active
07826278
ABSTRACT:
Semiconductor memory device includes a detection circuit configured to detect a voltage level of an external power supply voltage and a core voltage generation circuit configured to vary a voltage level of the core voltage according to an output signal of the detection circuit to generate a uniform core voltage.
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Park Jae-Boum
Yoon Seok-Cheol
Hynix / Semiconductor Inc.
IP & T Group LLP
Yoha Connie C
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