Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Bus or line termination
Reexamination Certificate
2007-12-06
2009-06-02
Chang, Daniel D (Department: 2819)
Electronic digital logic circuitry
Signal sensitivity or transmission integrity
Bus or line termination
C327S308000, C365S189050
Reexamination Certificate
active
07541831
ABSTRACT:
A semiconductor memory device includes a reference signal generating unit for generating a reference signal; a comparing unit for comparing the reference signal with a test signal applied to a test pad to output an adjusted value after adjusting the adjusted value until the test signal is equal to the reference signal; an impedance measuring unit for measuring an impedance of the test pad based on the adjusted value to output the test signal; an impedance adjusting unit for adjusting an impedance of a data I/O pad to have an impedance value corresponding to the adjusted value outputted when the test signal is equal to the reference signal; an impedance control unit for controlling the comparing unit so that the adjusted value is outputted when the test signal is equal to the reference signal; and a reference signal control unit for adjusting a voltage level of the reference signal.
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Chang Daniel D
Hynix / Semiconductor Inc.
Mannava & Kang P.C.
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