Semiconductor memory device containing antifuse write...

Static information storage and retrieval – Read/write circuit – Having fuse element

Reexamination Certificate

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C365S096000, C365S226000, C365S227000

Reexamination Certificate

active

07626881

ABSTRACT:
A semiconductor memory device that enables the reduction of the circuit scale of the antifuse write voltage generation circuit. The semiconductor memory device has a first internal power supply generation circuit that boosts an external power supply voltage to generate a first internal power supply, a memory core to which the first internal power supply is supplied, an antifuse memory for writing predetermined information, and also a write voltage generation circuit that boosts the first internal power supply to generate an antifuse write voltage.

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Korean Office Action dated Feb. 27, 2009.

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