Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2007-08-15
2009-12-01
Nguyen, Viet Q (Department: 2827)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S096000, C365S226000, C365S227000
Reexamination Certificate
active
07626881
ABSTRACT:
A semiconductor memory device that enables the reduction of the circuit scale of the antifuse write voltage generation circuit. The semiconductor memory device has a first internal power supply generation circuit that boosts an external power supply voltage to generate a first internal power supply, a memory core to which the first internal power supply is supplied, an antifuse memory for writing predetermined information, and also a write voltage generation circuit that boosts the first internal power supply to generate an antifuse write voltage.
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Korean Office Action dated Feb. 27, 2009.
Arent & Fox LLP
Fujitsu Microelectronics Limited
Nguyen Viet Q
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