Static information storage and retrieval – Read/write circuit – Testing
Patent
1998-04-09
1999-11-30
Nelms, David
Static information storage and retrieval
Read/write circuit
Testing
36523006, 36523003, G11C 700
Patent
active
059954299
ABSTRACT:
A semiconductor memory device capable of conducting test operations includes a plurality of word drivers which keep word lines in an active state when the word drivers are selected until the word drivers are reset. The semiconductor memory device further includes a control circuit which successively selects more than one of the plurality of word drivers so as to achieve simultaneous activation of word lines corresponding to selected ones of the plurality of word drivers during the test operations.
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"Generic DFT Approach for Pattern Sensitive Faults in Word-Oriented Memories", Amin et al, IEE Proc.-Comput. Digit. Tech., vol. 143, No. 3, May 1996, pp. 199-202.
Kojima Kazumi
Uchida Toshiya
Yanagisawa Makoto
Fujitsu Limited
Nelms David
Phung Anh
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