Semiconductor memory device capable of multiple word-line select

Static information storage and retrieval – Read/write circuit – Testing

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36523006, 36523003, G11C 700

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active

059954299

ABSTRACT:
A semiconductor memory device capable of conducting test operations includes a plurality of word drivers which keep word lines in an active state when the word drivers are selected until the word drivers are reset. The semiconductor memory device further includes a control circuit which successively selects more than one of the plurality of word drivers so as to achieve simultaneous activation of word lines corresponding to selected ones of the plurality of word drivers during the test operations.

REFERENCES:
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patent: 5615164 (1997-03-01), Kirihata et al.
patent: 5619460 (1997-04-01), Kirihata et al.
patent: 5652725 (1997-07-01), Suma et al.
"Generic DFT Approach for Pattern Sensitive Faults in Word-Oriented Memories", Amin et al, IEE Proc.-Comput. Digit. Tech., vol. 143, No. 3, May 1996, pp. 199-202.

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