Semiconductor memory device and test method thereof

Details Semiconductor memory device and test method thereof Semiconductor memory device and test method thereof

2006-05-30

2006-05-30

Auduong, Gene N. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S189070, C365S230060

Reexamination Certificate

active

07054209

ABSTRACT:
A semiconductor memory device vice disclosed herein comprises: a memory cell array divided into a plurality of blocks, each of which includes a plurality of memory cells; a plurality of row decoders which correspond to the blocks, each of the row decoders including an access information holder configured to hold access information indicating whether its corresponding row decoder has been accessed; and an access information reader configured to read the access information held in the access information holders.

REFERENCES:
patent: 4090258 (1978-05-01), Cricchi
patent: 5530839 (1996-06-01), Komoto
patent: 5532970 (1996-07-01), Butler et al.
patent: 5657469 (1997-08-01), Shimizu
patent: 6400604 (2002-06-01), Noda
patent: 6643180 (2003-11-01), Ikehashi et al.
patent: 6912166 (2005-06-01), Kawai et al.
patent: 2002/0048191 (2002-04-01), Ikehashi et al.

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