Semiconductor memory device and semiconductor integrated...

Static information storage and retrieval – Hardware for storage elements – Magnetic

Reexamination Certificate

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C365S149000, C365S189080

Reexamination Certificate

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07035128

ABSTRACT:
In a DRAM memory cell including an access Tr and a cell capacitor, a depletion type MOSFET is used for each of the access Tr and the cell capacitor. Thus, an operation margin can be increased and the number of necessary power supplied can be reduced, compared to a known DRAM.

REFERENCES:
patent: 5148393 (1992-09-01), Furuyama
patent: 5555206 (1996-09-01), Uchida
patent: 5872737 (1999-02-01), Tsuruda et al.
patent: 6088286 (2000-07-01), Yamauchi et al.
patent: 6631092 (2003-10-01), Yamasaki
patent: 6781915 (2004-08-01), Arimoto et al.
patent: 2002-522871 (2002-07-01), None
patent: WO 00/10171 (2000-02-01), None

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