Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-01-11
2011-01-11
Jackson, Jr., Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S004000, C257SE45002
Reexamination Certificate
active
07868315
ABSTRACT:
A phase change memory device including plural memory cells is disclosed. Each of the memory cells includes memory transistors and phase change film portions formed above or below the memory transistors. The phase change film portions correspond to the respective memory transistors respectively. Vias are provided in order to connect each of the memory transistor in parallel to each of the phase change film portions in each of the memory cells. The vias connect the memory cells in series to one another.
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Aochi Hideaki
Katsumata Ryota
Kidoh Masaru
Kito Masaru
Sato Mitsuru
Budd Paul A
Jackson, Jr. Jerome
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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