Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-05-19
2008-11-25
Doan, Theresa T (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S296000
Reexamination Certificate
active
07456455
ABSTRACT:
A semiconductor memory device comprises: a first interlayer insulating film formed on a semiconductor substrate; a capacitor formed above the first interlayer insulating film and composed of a lower electrode, a capacitor insulating film of a high dielectric film or a ferroelectric film, and an upper electrode; a second interlayer insulating film formed over the first interlayer insulating film to cover the capacitor; a first contact plug formed in the first interlayer insulating film to penetrate the first interlayer insulating film; and a second contact plug formed in the second interlayer insulating film to penetrate the second interlayer insulating film to make connection to the first contact plug. Between the first and second contact plugs, a first oxygen barrier film is interposed to come into contact with part of the boundary area between the first and second interlayer insulating films.
REFERENCES:
patent: 7186569 (2007-03-01), Rinerson et al.
patent: 7190015 (2007-03-01), Natori et al.
patent: 2003/0143800 (2003-07-01), Hall et al.
patent: 10-242418 (1998-09-01), None
Kutsunai Toshie
Mikawa Takumi
Doan Theresa T
McDermott Will & Emery LLP
Panasonic Corporation
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