Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2011-01-25
2011-01-25
Phan, Trong (Department: 2827)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S211000, C365S189050, C365S189080
Reexamination Certificate
active
07876636
ABSTRACT:
A semiconductor memory device performs a refresh operation stably even while a temperature continuously changes at near a specific temperature. The semiconductor memory device includes an on die thermal sensor (ODTS) and a control signal generator. The on die thermal sensor (ODTS) outputs a thermal code corresponding to a temperature of the semiconductor memory device. The control signal generator generates a self refresh control signal in response to the thermal code, wherein a state of the self refresh control signal does not change when the temperature variation is less than a predetermined value.
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Jeong Chun-Seok
Park Kee-Teok
Hynix / Semiconductor Inc.
IP & T Group LLP
Phan Trong
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