Semiconductor memory device and electronic apparatus

Static information storage and retrieval – Systems using particular element – Ferroelectric

Reexamination Certificate

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C365S149000, C365S214000

Reexamination Certificate

active

07463505

ABSTRACT:
A semiconductor memory device having: a memory cell array with m memory cells arranged in a first direction and n memory cells arranged in a second direction in a grid, each memory cell having a capacitor part using a ferroelectric film, and also having a first terminal, a second terminal, and a third terminal; two or more first wirings connecting the first terminals of the m memory cells arranged in the first direction; two or more second wirings connecting the second terminals of the n memory cells arranged in the second direction; two or more third wirings connecting the third terminals of the m memory cells, and means for selecting a third wiring from among the third wirings, the third wiring being selected based on the result of calculation in an adder circuit and a subtractor circuit.

REFERENCES:
patent: 6172925 (2001-01-01), Bloker
patent: 6252814 (2001-06-01), Tran et al.
patent: 6370057 (2002-04-01), Akita
patent: 6649945 (2003-11-01), Hosono et al.
patent: 6870754 (2005-03-01), Sakuma
patent: 2003/0103391 (2003-06-01), Kang
patent: 2003/0169616 (2003-09-01), Noro
patent: 2004/0090810 (2004-05-01), Sakuma
patent: 3597185 (2004-09-01), None
Shoichiro Kawashima, Bitline GND Sensing Technique for Low-Voltage Operation FeRAM, IEEE Journal of Solid-State Circuits, IEEE Service Center, Piscataway, NJ, US, vol. 37, No. 5, May 2002, pp. 592-598.
IEEE Journal of Solid-State Circuits, vol. 37, No. 5, May 2002 p. 592-598 “Bitline GND Sensing Technique for Low-Voltage Operation FeRAM”.

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