Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2006-02-03
2010-11-02
Dinh, Son (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S189011, C365S189140
Reexamination Certificate
active
07826253
ABSTRACT:
In a reading operation, an off time and a reading time of a holding control transistor is controlled by a replica circuit, so that a read margin is enlarged. Furthermore, a high power source potential and a low power source potential of an SRAM memory cell are switched in reading and writing operations of the memory cell and in a data holding state by a power source potential switching portion. As a result, a write margin is enlarged, and a leakage current is reduced.
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Dinh Son
NEC Corporation
Nguyen Nam
Sughrue & Mion, PLLC
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