Semiconductor memory device and driving method thereof

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Reexamination Certificate

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C365S189011, C365S189140

Reexamination Certificate

active

07826253

ABSTRACT:
In a reading operation, an off time and a reading time of a holding control transistor is controlled by a replica circuit, so that a read margin is enlarged. Furthermore, a high power source potential and a low power source potential of an SRAM memory cell are switched in reading and writing operations of the memory cell and in a data holding state by a power source potential switching portion. As a result, a write margin is enlarged, and a leakage current is reduced.

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Sakakibara, et al., “A 750MHz 144Mb Cache DRAM LSI with Speed Scalable Design and Programmable at-Speed Function-Array BIST”, 2003 IEEE International Solid-State Circuits Conference/Session 26/Embedded and Digital Systems/Paper 26.1, 2003, IEEE.
Yamaoka, et al., “A 300MHz 25 μA/Mb Leakage On-Chip SRAM Module Featuring Process-Variation Immunity and Low-Leakage-Active Mode for Mobile-Phone Application Processor”, 2004 IEEE International Solid-State Circuits Conference/Session 27/SRAM/27.2, 2004, IEEE.

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