Semiconductor memory device and data write and read method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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C714S719000, C714S744000

Reexamination Certificate

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07546497

ABSTRACT:
A semiconductor memory device includes a serial to parallel converter configured to generate parallel data at a parallel data rate in response to first serial data at first serial data rate in a first mode and configured to generate the parallel data at the parallel data rate in response to a second serial data at second serial data rate in a second mode, wherein the second serial data rate is less than the first serial data rate, and a data write circuit configured to provide the parallel data to a memory cell array.

REFERENCES:
patent: 6130846 (2000-10-01), Hori et al.
patent: 6373784 (2002-04-01), Maeda
patent: 6427197 (2002-07-01), Sato et al.
patent: 6765976 (2004-07-01), Oh
patent: 6978402 (2005-12-01), Hirabayashi
patent: 2003/0070052 (2003-04-01), Lai
patent: 2004/0257124 (2004-12-01), Araki et al.
patent: 2006/0031565 (2006-02-01), Iyer et al.
patent: 2002-015567 (2002-01-01), None
patent: 10-2004-0080784 (2004-09-01), None
patent: 2004-0095856 (2004-11-01), None
English language abstract of Korea Publication No. 2004-0095856.
English language abstract of Japanese Publication No. 2002-015567.

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