Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2011-08-02
2011-08-02
Dinh, Son T (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S063000, C365S189070, C365S189140
Reexamination Certificate
active
07990789
ABSTRACT:
A semiconductor memory device, in which a plurality of data output lines are commonly used by a plurality of banks, includes a plurality of gate circuits each of which are provided at each intermediate position of the plurality of the data output lines, and is controlled to be turned on during a normal operation mode and to be turned off at least when reading data during a parallel test mode, and a comparator circuit that inputs in parallel and compares a signal of each separated part of the each data output line separated by the plurality of the gate circuit being turned off.
REFERENCES:
patent: 6400623 (2002-06-01), Ohno
patent: 6438760 (2002-08-01), Wakefield et al.
patent: 2006/0123291 (2006-06-01), Kim
patent: 2000-40397 (2000-02-01), None
Ishikawa Toru
Nakazawa Shigeyuki
Dinh Son T
Elpida Memory Inc.
McGinn IP Law Group PLLC
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