Semiconductor memory device

Details Semiconductor memory device Semiconductor memory device

2011-03-29

2011-03-29

Le, Vu A (Department: 2824)

Static information storage and retrieval

Read/write circuit

Signals

C365S233100

Reexamination Certificate

active

07916560

ABSTRACT:
A semiconductor memory device can determine whether control for supplying termination resistances is normally performed or not by applying a test signal. The device includes a termination resistance driving controller configured to receive a plurality of termination resistance setting signals in synchronization with an external clock and a delay locked loop (DLL) clock to output a plurality of pre-driving signals and a plurality of termination resistance driving signals for a predetermined time. A data pre-driver is configured to output data in synchronization with the external clock. A test driving detector is configured to drive output nodes to a predetermined voltage level in response to a test signal and the plurality of pre-driving signals. A data output buffer is configured to apply termination resistances corresponding to the plurality of termination resistance driving signals to input/output pads, and output the data from the output nodes to the input/output pads.

REFERENCES:
patent: 4320508 (1982-03-01), Takezoe
patent: 2007-0036473 (2007-04-01), None

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