Semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing

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365149, 371 211, G11C 2900

Patent

active

052087778

ABSTRACT:
A circuit for carrying out ordinary "write" and "read" operation during operation of applying a test voltage to a cell opposite electrode in test operation is provided. The circuit converts a test mode instruction signal to an ordinary operation instruction signal in a semiconductor memory device. The test mode instruction signal can be applied to an input pin of the semiconductor memory device, so that the test operation can be carried out even after the assembly of the semiconductor memory device.

REFERENCES:
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patent: 5079743 (1992-01-01), Suwa et al.
patent: 5109382 (1992-04-01), Fukunawa
patent: 5117393 (1992-05-01), Miyazawa et al.
patent: 5134587 (1992-07-01), Steele

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