Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-02-03
2000-02-15
Brown, Glenn W.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324759, 324765, G01R 3126
Patent
active
060257334
ABSTRACT:
A semiconductor memory device includes two subcircuits each including a memory circuit, a semiconductor circuit, and a logical circuit. Connection pads are divided into only two parallel rows located along the outer periphery of the semiconductor memory device. Each of the pads may include a probe region against which a probe is pressed for testing the semiconductor memory circuit, and a wire region to which a wire is connected upon packaging.
REFERENCES:
patent: 5514975 (1996-05-01), Sartwell et al.
patent: 5670890 (1997-09-01), Colwell et al.
Hatakenaka Makoto
Kitaguchi Akira
Matsuo Masaaki
Nakano Toshio
Saitoh Tuyoshi
Brown Glenn W.
Mitsubishi Denki & Kabushiki Kaisha
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