Static information storage and retrieval – Read/write circuit – Testing
Patent
1997-04-21
1998-12-29
Yoo, Do Hyun
Static information storage and retrieval
Read/write circuit
Testing
36518911, 365191, G11C 700
Patent
active
058547657
ABSTRACT:
A semiconductor memory device includes a memory cell portion and at least one output part being provided with a plurality of read data which are read from the memory cell portion and a mode selection signal. The output part has a logic decision circuit for producing a control signal indicating whether logic levels of the plurality of read data are all the same, and an output circuit controlling to operate in at least one of two states, a first state being to transmit first read data of the plurality of read data to an output port of the output circuit and a second state being to set the output port to be at a high-impedance state depending on the control signal and the mode selection signal. In the output part, when the mode selection signal indicates a normal mode, the output circuit operates in said first state, and when the mode selection signal indicates a test mode, the output circuit operates in one of said first state and said second state depending on the control signal.
REFERENCES:
patent: 5444661 (1995-08-01), Matsui
patent: 5469394 (1995-11-01), Kumakura et al.
patent: 5500824 (1996-03-01), Fink
Fujitsu Limited
Yoo Do Hyun
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