Semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing

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365200, 371 101, G11C 1300

Patent

active

054249899

ABSTRACT:
A semiconductor memory device having information data storing cells and error correction data storing memory cells. When information data is inputted, error correction data related to the information data is formed. In a usual use, the information data and the error correction data are stored in the corresponding memory cells. An external test signal, inputted as the information data, can be stored in the error correction data storing memory cells by a write control signal. In a usual use, the information data stored in the information data storing cells are outputted, as they are or corrected if erroneous. The test signal stored in the error correction data storing memory can be outputted by an output control signal.

REFERENCES:
patent: 4389715 (1983-06-01), Eaton et al.
patent: 4727516 (1988-02-01), Yoshida et al.
patent: 5199033 (1993-03-01), McGeoch et al.

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