Semiconductor memory device

Static information storage and retrieval – Systems using particular element – Ferroelectric

Reexamination Certificate

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Details

C365S189140, C365S189150, C365S189160, C365S193000, C365S195000, C365S222000, C365S233140, C365S233160, C365S233170, C365S233190

Reexamination Certificate

active

08045357

ABSTRACT:
A memory includes a memory cell array including destructive read-out type memory cells; a decoder selecting a cell; a sense amplifier configured to detect the data; and a read and write controller controlling a read operation and a write operation, wherein the read and write controller outputs a logical value of a write enable signal at the start of the read operation in a first period and makes the write enable signal invalid after the read operation starts during the first period, on the basis of the write enable signal and a restore signal keeping an activated state during the first period, the write enable signal being a signal allowing the write operation, the first period being a period from when the read operation starts to when a restore operation for writing the data back to the memory cell is completed.

REFERENCES:
patent: 5619470 (1997-04-01), Fukumoto
patent: 5835400 (1998-11-01), Jeon et al.
patent: 5892705 (1999-04-01), Chung
patent: 2003/0218925 (2003-11-01), Torjussen et al.
patent: 2006/0146592 (2006-07-01), Lee et al.
patent: 2006/0277367 (2006-12-01), Faber
patent: 2007/0016719 (2007-01-01), Ono et al.
patent: 2008/0111575 (2008-05-01), Ogiwara et al.
patent: 2009/0096506 (2009-04-01), Ogiwara et al.
Explanation of Non-English Language References in 2 pages.

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