Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2008-09-10
2010-06-29
Dinh, Son (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S189150, C257S351000
Reexamination Certificate
active
07746685
ABSTRACT:
SRAM cells are arranged in matrix along a first and a second bit line and a word line for single-ended reading of data from the second bit line. A first NMOS transistor and a first transfer transistor contained in the SRAM cell are formed in a first well with respective identical gate lengths and gate widths. A second NMOS transistor and a second transfer transistor contained in the SRAM cell are formed in a second well with respective identical gate lengths and gate widths. These gate widths are made wider than the gate widths of the first NMOS transistor and the first transfer transistor.
REFERENCES:
patent: 6363006 (2002-03-01), Naffziger et al.
patent: 7400524 (2008-07-01), Otsuka
patent: 2-151066 (1990-06-01), None
patent: 2001-28401 (2001-01-01), None
patent: 2003-86713 (2003-03-01), None
U.S. Appl. No. 12/343,996, filed Dec. 24, 2008, Kawasumi.
Kawasumi Atsushi
Sasaki Takahiko
Dinh Son
Kabushiki Kaisha Toshiba
Nguyen Nam
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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