Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2007-01-19
2010-11-16
Rizk, Sam (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
C714S752000, C714S758000
Reexamination Certificate
active
07836377
ABSTRACT:
A semiconductor memory device has a built-in error detection and correction system, wherein the error detection and correction system is formed to have a cyclic code, with which multiple error bits are correctable, and wherein the cyclic code is configured in such a manner that a certain number of degrees are selected as information bits from the entire degree of an information polynomial having degree numbers corresponding to an error-correctable maximal bit number, the certain number being a number of data bits which are simultaneously error-correctable in the memory device.
REFERENCES:
patent: 4509172 (1985-04-01), Chen
patent: 4556977 (1985-12-01), Olderdissen et al.
patent: 5107503 (1992-04-01), Riggle et al.
patent: 6185134 (2001-02-01), Tanaka
patent: 7076722 (2006-07-01), Shibata
patent: 7096313 (2006-08-01), Chang et al.
patent: 2006/0239073 (2006-03-01), Toda
U.S. Appl. No. 11/845,999, filed Aug 28, 2007, Toda.
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Rizk Sam
LandOfFree
Semiconductor memory device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor memory device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4178170