Static information storage and retrieval – Systems using particular element – Resistive
Reexamination Certificate
2007-08-13
2009-06-02
Nguyen, Viet Q (Department: 2827)
Static information storage and retrieval
Systems using particular element
Resistive
C365S171000, C365S173000, C365S158000
Reexamination Certificate
active
07542326
ABSTRACT:
A semiconductor memory device comprises an array of memory cells each comprising a variable resistance element and a cell access transistor, and a voltage supplying means for applying the first voltage between the bit and source lines connected to the selected memory cell, the third voltage to the word line to apply the first write voltage between the two ports of the variable resistance element for shifting the resistance from the first state to the second state, and the second voltage opposite in polarity to the first voltage between the bit and source lines, the third voltage to the word line to apply the second write voltage opposite in polarity to and different in the absolute value from the first write voltage between the two ports for shifting the resistance from the second state to the first state, the voltage supplying means comprising an n-channel MOSFET and a p-channel MOSFET.
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Zhuang et al. (Dec. 2002). “Novell Colossal Magnetoresistive Thin Film Nonvolatile Resistance Random Access Memory (RRAM),” IEDM Report No. 7.5.
Horii Shinji
Sato Shin'ichi
Yamagata Satoru
Yoshimura Satoshi
Morrison & Foerster / LLP
Nguyen Viet Q
Sharp Kabushiki Kaisha
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