Semiconductor memory device

Details Semiconductor memory device Semiconductor memory device

2005-04-11

2008-12-16

Chaudry, M. Mujtaba K. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Error count or rate

C714S718000, C714S710000

Reexamination Certificate

active

07467337

ABSTRACT:
Disclosed is a semiconductor memory device capable of arbitrarily setting an upper limit of the number of error corrections during a test operation. The semiconductor memory device has a counter, a register, and a comparison circuit. The counter counts the number of error corrections. The register, when an upper limit setting signal is externally inputted to change the upper limit of the number of error corrections, changes the upper limit. The comparison circuit compares the number of error corrections with the changed upper limit.

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