Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2008-04-08
2008-04-08
Phung, Ahn (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S203000
Reexamination Certificate
active
11396193
ABSTRACT:
A semiconductor memory device includes a first first-type well including a first cell array for storing a data to apply the data to one of a first bit line and a first bit line bar, and a first precharge MOS transistor having a second-type channel for equalizing voltage levels of the first bit line and the first bit line bar; a first second-type well including a first sense amplifying MOS transistor having a first-type channel for sensing and amplifying the signal difference between the first bit line and the first bit line bar, and a first connection MOS transistor; and a second first-type well including a second sense amplifying MOS transistor having a second-type channel for sensing and amplifying the signal difference between the first bit line and the first bit line bar.
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Ahn Jin-Hong
Kang Hee-Bok
Blakely & Sokoloff, Taylor & Zafman
Hynix / Semiconductor Inc.
Phung Ahn
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