Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2007-02-27
2007-02-27
Mai, Son L. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S222000
Reexamination Certificate
active
11172894
ABSTRACT:
A semiconductor memory device is provided for minutely changing a refresh interval according to a detected temperature and thereby lowering its power consumption. A temperature detector detects a temperature of a chip and outputs the corresponding temperature signal. A reference temperature signal output unit outputs the corresponding reference temperature signal with each of different reference temperatures to be compared with the chip temperature according to a selection signal. A temperature comparison unit compares the chip temperature with the reference temperature through the temperature signal and the reference temperature signal. A selection signal output unit outputs the selection signal according to the compared result of the temperature comparison unit. A refresh interval control unit changes the refresh interval according to the compared result of the temperature comparison unit.
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Arent & Fox PLLC
Mai Son L.
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