Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2007-02-27
2007-02-27
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S227000, C365S228000
Reexamination Certificate
active
11154625
ABSTRACT:
A semiconductor memory device including an on-chip ECC circuit and having a data retention mode which includes, in the order of state transition, an encoding state EEST by an error correction circuit in which the error correction circuit carries out calculation of parity bits of data of the memory cells, a burst self-refresh state BSST in which the memory cells are self-refreshed in a burst with a period shorter than in ordinary self-refresh, a power-off state PFST in which an internal power supply circuit is partially turned off, a power-on state PNST in which the internal power supply circuit, partially turned off, is turned on, and a decoding state EDST by the error correction circuit in which the error correction circuit corrects errors of the memory cells. In case a command for exiting from the data retention mode in the encoding state, transition may be made to an idle state IST so that re-entry may be made from the decoding state EDST to the BSST.
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Hashimoto Takeshi
Ito Yutaka
Kaneda Masayuki
Takeuchi Shigeo
Yamasaki Eiji
Elpida Memory Inc.
Luu Pho M.
Phung Anh
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