Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-07-24
2007-07-24
Baumeister, B. William (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S306000, C257SE21648, C257SE21660
Reexamination Certificate
active
11202069
ABSTRACT:
A semiconductor memory device having a transistor formed on a semiconductor substrate and a capacitor formed on the upper layer of the transistor and electrically connected to the transistor, includes: a cell contact which is formed on a first interlayer insulation film covering the transistor and is electrically connected to the transistor; a bit contact which is formed on a second interlayer insulation film provided on the first interlayer insulation film and is electrically connected to the cell contact; a bit line which is formed on the second interlayer insulation film and is connected to the bit contact; a capacitor which is formed on a third interlayer insulation film covering the bit line; a capacitor contact which is formed through the third and second interlayer insulation film and makes a connection between the capacitor and the cell contact; and a side wall which has an etching selectivity with the second and third interlayer insulation films formed on the surface of the bit line.
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Arai Shintaro
Inoue Ken
Anya Igwe U.
Baumeister B. William
Dickstein , Shapiro, LLP.
NEC Electronics Corporation
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