Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2007-05-15
2007-05-15
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C257S529000, C257S209000, C365S225700
Reexamination Certificate
active
11293378
ABSTRACT:
A semiconductor memory device includes a fuse element including a first terminal and a second terminal, which stores data based on whether or not it is electrically blown by a laser beam, a resistance element connected to the first terminal, a node in which the data is transferred, and a transistor provided between the resistance element and the node, which sets the data to the node.
REFERENCES:
patent: 5457656 (1995-10-01), Fu
patent: 6438044 (2002-08-01), Fukuda
patent: 6477072 (2002-11-01), Shimizu et al.
patent: 6525350 (2003-02-01), Kinoshita et al.
patent: 6762918 (2004-07-01), Voldman
patent: 2004-111959 (2004-04-01), None
Fujii Shuso
Fukuda Ryo
Watanabe Yohji
Hoang Huan
Tran Anthan
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