Semiconductor memory device

Static information storage and retrieval – Read/write circuit – Differential sensing

Reexamination Certificate

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Details

C365S230030, C365S233100, C365S190000

Reexamination Certificate

active

06996020

ABSTRACT:
A plurality of dummy bit lines are disposed together with a plurality of bit line pairs in a memory cell array. In selectively driving a memory cell connected to the bit line pair, a timing control circuit controls the timing of the driving operation, based on signal change in the plural dummy bit lines, thereby detecting the influences of the process variation in a plurality of positions in the memory cell array. Thus, the influence of the process variation given to the operation of a semiconductor memory device can be further alleviated, compared with the case when one dummy bit line is used.

REFERENCES:
patent: 5268869 (1993-12-01), Ferris et al.
patent: 5408438 (1995-04-01), Tanaka et al.
patent: 5886939 (1999-03-01), Choi et al.
patent: 07093972 (1995-04-01), None
patent: 11339476 (1999-12-01), None

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