Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-05-23
2006-05-23
Kang, Donghee (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S300000, C257S302000, C257S303000, C257S304000, C438S242000, C438S243000, C438S244000, C438S253000
Reexamination Certificate
active
07049647
ABSTRACT:
A semiconductor memory cell is formed in a substrate and includes a trench capacitor and a selection transistor. The trench capacitor includes a capacitor dielectric and a conductive trench filling. Disposed on the conductive trench filling is a diffusion barrier on which an epitaxial layer is formed. The selection transistor is disposed as a planar transistor above the trench capacitor. A drain doping region of the selection transistor is disposed in the epitaxial layer.
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Karcher Wolfram
Schrems Martin
Temmler Dietmar
Greenberg Laurence A.
Infineon - Technologies AG
Kang Donghee
Locher Ralph E.
Stemer Werner H.
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