Registers – Records – Conductive
Reexamination Certificate
2004-09-13
2010-02-02
Hess, Daniel A (Department: 2876)
Registers
Records
Conductive
C711S001000, C711S100000
Reexamination Certificate
active
07654466
ABSTRACT:
A host information memory is provided in a semiconductor memory card and a data write start address and a data size supplied by an access unit are stored. A free physical area generation section determines whether or not to perform erasing of an invalid block of a nonvolatile memory when writing of data based on the data write start address and data size, and determines the number of blocks to be erased. When erasing, writing of data and erasing of invalid blocks are simultaneously performed with respect to different memory chips. Erase process of data, herewith, can be optimized and high speed access from the access unit to a semiconductor memory card can be realized.
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Gotoh Yoshiho
Horiuchi Koichi
Inoue Manabu
Inoue Shinji
Izumi Tomoaki
Hess Daniel A
Panasonic Corporation
Smith Patent Office
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