Semiconductor memory apparatus, test apparatus therefor and meth

Details Semiconductor memory apparatus, test apparatus therefor and meth Semiconductor memory apparatus, test apparatus therefor and meth

1993-04-06

1994-08-30

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

Testing

365200, 371 211, G11C 700

Patent

active

053434315

ABSTRACT:
A semiconductor memory apparatus capable of judging whether or not there is short circuit between bit lines 1 (word lines) by respectively connecting a plurality of the bit lines 1 (word lines), wired in parallel to each other so as to select memory cell for outputting data from a memory cell array 4 in which memory cells are arranged in the form of matrix, connected to power source potential line 14 and ground potential line 16 alternately through switching elements 5, 6 respectively, thereby measuring leak current flowing between the both lines 14 and 16 in the state where the switching elements 5, 6 are ON, a testing apparatus being provided with a power source 10 supplying to each of the switching elements 5, 6 of this semiconductor memory apparatus and with an ampere meter 11 for measuring leak current, and relieving method for the semiconductor memory apparatus from short circuit between the bit lines (word lines) by making the switching elements 5, 6 ON as well as applying overvoltage to the bit lines (word lines) from the power source 10, thereby generating Joule heat at foreign matter which short-circuits between adjacent bit lines 1 (word lines) so as to burn off the foreign matter by the Joule heat.

REFERENCES:
patent: 4744058 (1988-05-01), Kawashima
patent: 4860260 (1989-08-01), Saito
patent: 5181205 (1993-01-01), Kertis

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