Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2008-01-15
2008-01-15
Le, Thong Q. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S200000
Reexamination Certificate
active
07319628
ABSTRACT:
A semiconductor memory includes a plurality of memory portions; and a plurality of spare memory portions. The memory portion includes: a main cell array which includes memory cells, a first reference cell which stores a first reference data in a nonvolatile state, and a first sense amplifier which reads a first state of the memory cell based on the first state and a second state of the first reference cell. The memory cell stores data in a nonvolatile state. The spare memory portion includes: a spare cell array which includes spare cells as spares of the memory cells, a second reference cell which stores a second reference data in a nonvolatile state, and a second sense amplifier which reads a third state of the spare cell based on the third state and a fourth state of the second reference cell. The memory portion having a defect on the first reference cell is replaced with the spare memory portion.
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Le Thong Q.
NEC Electronics Corporation
Sughrue & Mion, PLLC
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