Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2011-03-08
2011-03-08
Dinh, Son (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S189070, C365S201000, C365S203000
Reexamination Certificate
active
07903484
ABSTRACT:
A semiconductor memory is provided which performs redundancy on a memory cell by a given bit unit, the semiconductor memory includes: a comparator circuit that compares an input address and a redundancy address; a judgment circuit that judges whether to perform the redundancy based on a compared result, wherein the judgment circuit outputs a plurality of redundancy judgment signals that indicates whether to perform redundancy for each portion obtained by dividing the given bit unit by n which is an integer equal to or greater than two.
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Dinh Son
Fujitsu Patent Center
Fujitsu Semiconductor Limited
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