Semiconductor memory

Details Semiconductor memory Semiconductor memory

1998-04-09

1999-12-21

Nelms, David

Static information storage and retrieval

Read/write circuit

Testing

36523006, 36518908, G11C 700

Patent

active

060058153

ABSTRACT:
A semiconductor memory provided, in addition to the regular components essential for a memory, with a unit employable for more accelerated burn-in test or an insulation test applicable to a semiconductor memory to be conducted by application of a voltage higher than the normal voltage at a temperature higher than the ambient temperature, to every other one of the word lines or the bit lines or to every word lines of which the numbers are odd or even, while the potential of the other lines are kept at the ground level.

REFERENCES:
patent: 5293340 (1994-03-01), Fujita
patent: 5363333 (1994-11-01), Tsujimoto
patent: 5615164 (1997-03-01), Kirihata et al.

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