Semiconductor memory

Details Semiconductor memory Semiconductor memory

2008-04-22

2008-04-22

Mai, Son L. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S189070, C365S230030

Reexamination Certificate

active

11714766

ABSTRACT:
In order to give all memory blocks the same structure, a redundancy word line and a redundancy bit line are formed in each memory block. A redundancy column selection line is wired in common to the memory blocks. Column redundancy circuits are formed to correspond to respective memory groups each of which consists of a prescribed number of memory blocks, and become effective according to enable signals. A column redundancy selection circuit activates an enable signal according to a block address signal when all row hit signals are deactivated. When one of the row hit signals is activated, the column redundancy selection circuit activates the enable signal corresponding to the activated row hit signal. Since the column redundancy circuit for an arbitrary memory group can be made effective according to the row hit signals, failure relief efficiency can be increased without deteriorating the electric characteristic during an access operation.

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Kiyohiro Furutani, et al., “Highly Flexible Row and Column Redundancy and Cycle Time Adaptive Read Data Path for Double Data Rate Synchronous Memories”, IEICE Trans. Electron., vol. E88-C, No. 2, Feb. 2005, pp. 255-263.

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