Semiconductor light emitting device, method of manufacturing...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor

Reexamination Certificate

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C257SE33028

Reexamination Certificate

active

08030109

ABSTRACT:
A semiconductor light emitting device capable of realizing a long life, and a method of manufacturing the same. The impurity concentration of hydrogen in the active layer is 3×1019cm−3or less, and the impurity concentration of aluminum in the active layer is 1×1018cm−3or less. Thereby, the operating current is inhibited from increasing, and a long life can be realized.

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Saito et al. “Hydogen reduction in GaAsN thin film by flow rate modulated chemical beam epitaxy,” Thin Solin Films, vol. 516, p. 3517-3520, 2008.
Japanese Office Action dated Apr. 21, 2010 for Japanese Application No. 2005-042771.
Japanese Office Action for Application No. 2005-042771 dated Sep. 27, 2010.

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