Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With particular dopant concentration or concentration profile
Reexamination Certificate
2011-06-07
2011-06-07
Pham, Thanh V (Department: 2894)
Active solid-state devices (e.g., transistors, solid-state diode
Incoherent light emitter structure
With particular dopant concentration or concentration profile
C257S103000, C438S022000, C438S037000
Reexamination Certificate
active
07956380
ABSTRACT:
A semiconductor light-emitting device is provided. In an InGaN-based semiconductor light-emitting device including an Ag electrode, a semiconductor layer on the contact side of at least the Ag electrode is a dislocation semiconductor layer of which dislocation density is selected to be less than 1×107 (1/cm2) and thereby short-circuit caused by Ag migration generated along this dislocation can be avoided. Thus, this semiconductor light-emitting device is able to solve a problem of a shortened life and a problem with the fraction of defective devices encountered with the InGaN-based semiconductor light-emitting device.
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Japanese Office Action issued on May 11, 2010, for corresponding Japanese Patent Application No. 2005-010617.
Biwa Goshi
Doi Masato
Okuyama Hiroyuki
Suzuki Jun
K&L Gates LLP
Pham Thanh V
Sony Corporation
Tran Tony
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