Semiconductor integrated circuit with multi test

Details Semiconductor integrated circuit with multi test Semiconductor integrated circuit with multi test

2009-01-30

2011-10-25

Pham, Ly D (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S191000, C365S195000, C365S196000, C365S230030

Reexamination Certificate

active

08045408

ABSTRACT:
A semiconductor integrated circuit includes a multi-mode control signal generating unit configured to control an activation of a up/down mat I/O switch control signal, which controls I/O switches in a up/down mat, according to a multi-test mode signal and a read/write discriminating signal, a multi-mode decoder configured to output multi-mat select signals to simultaneously activate a plurality of mats according to a multi-test mode active write signal, and a mat controller configured to enable word lines and the I/O switches according to the up/down mat I/O switch control signal and the multi-mat select signals.

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