Semiconductor integrated circuit with functional test mode to ra

Details Semiconductor integrated circuit with functional test mode to ra Semiconductor integrated circuit with functional test mode to ra

1991-06-20

1993-11-30

Pascal, Robert J.

Static information storage and retrieval

Read/write circuit

Testing

371212, G11C 700

Patent

active

052672069

ABSTRACT:
A semiconductor integrated circuit comprises a random access memory subjected to a functional test by a testing unit with a multi-bit testing data, and the multi-bit testing data is distributed to parts of a write-in data port of the random access memory device through a plurality sets of auxiliary write-in data line groups, because the write-in data port can accept a multi-bit write-in data larger in number than the multi-bit testing data, wherein a comparator is coupled to parts of the read-out data port for producing a reporting signal indicative of consistency or inconsistency so that the testing unit examines the random access memory device with the read-out bit at one of the parts of the read-out data port and the reporting signal.

REFERENCES:
patent: 3805152 (1974-04-01), Ebersman et al.
patent: 5117393 (1992-05-01), Miyazawa et al.

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit with functional test mode to ra does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit with functional test mode to ra, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit with functional test mode to ra will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2102926