Semiconductor integrated circuit having functional modules...

Details Semiconductor integrated circuit having functional modules... Semiconductor integrated circuit having functional modules...

2006-08-22

2006-08-22

Baderman, Scott (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S036000, C714S724000, C714S733000

Reexamination Certificate

active

07096386

ABSTRACT:
A semiconductor integrated circuit that allows a self test of an integrated circuit built into a system to be conducted through a circuit structure on a smaller scale and achieves an improvement in the accuracy of the self test is provided. An integrated circuit includes functional modules respectively provided with built-in self testing circuits and a self test control circuit that individually controls the built-in self testing circuits. This structure allows self tests to be automatically performed within the integrated circuit without requiring external components. The scale of the system having the built-in integrated circuit may thus be reduced. Also, by building up the built-in self testing circuits in the individual functional modules to a sufficient degree, a high-quality self test comparable to that conducted prior to shipment can be performed even after the integrated circuit is built into the system.

REFERENCES:
patent: 5861774 (1999-01-01), Blumenthal
patent: 6255836 (2001-07-01), Schwarz et al.
patent: 6311300 (2001-10-01), Omura et al.
patent: 6436741 (2002-08-01), Sato et al.
patent: 6871297 (2005-03-01), Puri et al.
patent: 2002/0147949 (2002-10-01), Lamb et al.
Sudhakar M. Reddy and et al., “A Data Compression Technique for Built-In Self-Test” published by IEEE Transactions on Computers, vol. 37, No. 9, Sep. 1988, pp. 1151-1156.

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