Static information storage and retrieval – Read/write circuit – Testing
Patent
1999-03-22
2000-03-07
Nguyen, Viet Q.
Static information storage and retrieval
Read/write circuit
Testing
365193, 36518907, 365191, 371 211, G11C 700
Patent
active
060349077
ABSTRACT:
A semiconductor memory device has a device identification code to see whether or not a packet signal is addressed thereto, and a timing generator starts a control sequence for a data access in response to a hit signal representative of the consistency between the stored device identification code and an input device identification code incorporated in the packet signal, wherein a signal receiving circuit is shared between the packet signal and a test signal representative of instructions for burn-in test, and a logic gate is provided for directly generating the hit signal from an internal mode signal representative of the test mode so that the timing generator starts the control sequence in the burn-in test regardless of the consistency between the test signal and the stored device identification code.
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patent: 5917766 (1999-06-01), Tsuji et al.
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NEC Corporation
Nguyen Viet Q.
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