Semiconductor integrated circuit device, pattern detection...

Details Semiconductor integrated circuit device, pattern detection... Semiconductor integrated circuit device, pattern detection...

2011-04-12

2011-04-12

Lauture, Joseph (Department: 2819)

Coded data generation or conversion

Digital code to digital code converters

Serial to parallel

C341S101000

Reexamination Certificate

active

07924185

ABSTRACT:
A shift register SR configured to successively take in and hold input serial data on the basis of a first clock signal, a pattern detection section configured to detect a predetermined pattern contained in the serial data taken in the shift resister and a second clock generation section configured to determine timing of output of the serial data held in the shift register on the basis of a result of this detection are provided to detect the desired pattern contained in the serial data in the course of transferring the serial data for conversion from the serial data to parallel data to the shift resister, and to determine timing of conversion to the parallel data on the basis of a result of this detection, thus reducing the latency and achieving an improvement in communication speed and a reduction in circuit area.

REFERENCES:
patent: 5287389 (1994-02-01), Ichibangase et al.
patent: 6265996 (2001-07-01), Duffy
patent: 6459393 (2002-10-01), Nordman
patent: 6999543 (2006-02-01), Trinh et al.
patent: 7463171 (2008-12-01), Baba

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