4. Coded data generation or conversion
  5. Digital code to digital code converters
  6. Serial to parallel

Hiroto Fukuhisa

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Self-repairing semiconductor device having a testing unit...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit device, pattern detection...

Coded data generation or conversion – Digital code to digital code converters – Serial to parallel
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2308856

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