Semiconductor integrated circuit device in which a measure...

Details Semiconductor integrated circuit device in which a measure... Semiconductor integrated circuit device in which a measure...

2006-09-12

2006-09-12

Nguyen, Tuan T. (Department: 2824)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S189070, C365S189050, C365S149000

Reexamination Certificate

active

07106642

ABSTRACT:
A semiconductor integrated circuit device includes a first memory circuit which stores normal data, a second memory circuit which stores determination information used to determine whether a value of the normal data is changed or not, and a determination circuit which determines whether a value of the normal data is changed or not based on the determination information. The capacitance of a data storage node of the second memory circuit is larger than that of a data storage node of the first memory circuit.

REFERENCES:
patent: 5640350 (1997-06-01), Iga
patent: 6898130 (2005-05-01), Kajigaya et al.
patent: 2004/0190085 (2004-09-01), Silverbrook et al.
patent: 8-161884 (1996-06-01), None
patent: 2003-59290 (2003-02-01), None

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