Semiconductor integrated circuit device having test circuit

Details Semiconductor integrated circuit device having test circuit Semiconductor integrated circuit device having test circuit

2006-12-05

2006-12-05

Mai, Son L. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S189050, C326S016000, C326S046000, C327S202000, C714S726000

Reexamination Certificate

active

07145818

ABSTRACT:
A semiconductor integrated circuit device is provided with a diagnosis circuit, which does not increase the delay of a logic element in normal operation. In a latch provided at the output of a memory or at the input of a logic stage, a signal selector is provided in the feedback loop of the latch. The selector is switched in correspondence with the operation mode, such that it transfers the feedback signal in normal operation, while it transfers the test signal in a test mode, in order to prevent the delay from increasing in the signal selector on the main path in normal operation.

REFERENCES:
patent: 5654658 (1997-08-01), Kubota et al.
patent: 5701307 (1997-12-01), Whetsel
patent: 5938783 (1999-08-01), Whetsel
patent: 6429713 (2002-08-01), Nakaizumi
patent: 6536003 (2003-03-01), Gaziello et al.
patent: 6560150 (2003-05-01), Abedifard

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