Semiconductor integrated circuit device having operation...

Details Semiconductor integrated circuit device having operation... Semiconductor integrated circuit device having operation...

2007-05-29

2007-05-29

Le, Dieu-Minh (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S733000

Reexamination Certificate

active

10354139

ABSTRACT:
When an operation test is performed to a plurality of circuit blocks each having the same circuit configuration, common test pattern data is transmitted to the respective circuit blocks through corresponding selector circuits.

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Japanese Office Action, with English-language translation, dated Nov. 21, 2006.

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