Semiconductor integrated circuit device having confirmable self-

Details Semiconductor integrated circuit device having confirmable self- Semiconductor integrated circuit device having confirmable self-

1998-05-27

1999-09-14

Hoang, Huan

Static information storage and retrieval

Read/write circuit

Testing

371 221, G11C 700, G01R 3126

Patent

active

059532734

ABSTRACT:
A semiconductor dynamic random access memory device enters into a test mode at a WE/CAS-Before-RAS timing, and selectively carries out self-diagnostic functions under application of a super voltage; when the super voltage is applied to a signal pin, a super voltage detecting circuit checks it to see whether the potential level exceeds the positive power voltage, and supplies a control signal representative of detection of the super voltage to a test control signal generating circuit for producing a test entry signal and to a data pin through a selector so as to allow an analyst to confirm the entry into the self-diagnostic function.

REFERENCES:
patent: 5335202 (1994-08-01), Manning et al.
patent: 5712575 (1998-01-01), Ma et al.
patent: 5727001 (1998-03-01), Loughmiller

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